Combined X-ray Diffraction and Density Functional Study of [Ni(NO)(η5-Cp*)] in the Ground and Light-Induced Metastable States

نویسندگان

  • Dmitry V. Fomitchev
  • Thomas R. Furlani
چکیده

The crystal structure of [Ni(NO)(η5-Cp*)] in the light-induced metastable state was determined by X-ray diffraction at 25 K of a crystal with a 47% metastable-state population. The most significant geometrical change is the formation of a side (η2) bound structure with an Ni-N-O angle of 92(1)°, compared with 179.2(2)° in the most stable configuration, and a corresponding Ni-O distance of 2.09 Å. An elongation of the Ni-N bond by 0.08(1) Å and local distortions in the pentamethylcyclopentadienyl ring are also observed. Geometry optimizations, carried out using density functional theory, confirm that the [Ni(η2-NO)(η5-Cp*)] structure corresponds to a local minimum with energy 0.99 eV above that of the stable isomer and predict a second local minimum at 1.85 eV for the isonitrosyl, [Ni(ON)(η5-Cp*)], structure. Geometrical parameters obtained from the theoretical calculation for [Ni(η2-NO)(η5-Cp*)] agree reasonably well with the experimental findings. This is the first example of a sidebound nitrosyl complex generated by photoirradiation of an {M(NO)}10 ground-state configuration. Its geometry is comparable with that of the photoinduced metastable state (MS2) of sodium nitroprusside, which in its ground state has the {M(NO)}6 configuration.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

X-ray Charge-Dens Study of 5-Chloro-8-hydroxy-6-methyloaphthalene-l.4-dione: A Hydroxynaphthoquinone Derivative

The X-ray charge density analysis of a hydroxynaphthoquinnne derivative was obtained by multipolar Hansen-Coppens formalism refinement through high resolution X-ray diffraction data at 100(1) K. The molecularproperties of the title compound resulted from the combined experimental and the quantum theory of atoms inmolecules (QTAIM) studies. The topological properties of the covalent bonds and of...

متن کامل

"Physical properties and electronic structure of LaNi5 compound before and after hydrogenation: An experimental and theoretical approach"

The present study deals with the experimental and theoretical approaches of LaNi5 hydrogen storage alloy. The structural, morphological and hydrogenation characterization of this sample which is synthesized by the arc melting technique were carried out by X-ray diffraction, scanning electron microscopy and a homemade Sievert's type apparatus, respectively. The results showed that after several ...

متن کامل

Bi-functional NaLuF4:Gd3+/Yb3+/Er3+ nanocrystals: hydrothermal synthesis, optical and magnetic properties

Magnetic-fluorescent lanthanide doped sodium lutetium fluoride (NaLuF4:Yb3+/Er3+/Gd3+) nanocrystals were synthesized via facile hydrothermal method by varying concentration of Gd3+. Powder X-ray powder diffraction (PXRD), scanning electron microscopy (SEM),transmission electron microscopy (TEM), energy dispersive X-ray spectroscopy (EDS), p...

متن کامل

Translucent tile construction and its properties

Translucent tiles are among the tiles that have recently been featured. Passing part of the light is an important feature of these tiles. The passage of light from within, create a beautiful effect. In particular, it can be combined with LED, in which its beauty will be multiplied. In this research, the effect of using transparent frit and feldspar on porcelain tile composition was studied to o...

متن کامل

Influence of Ni Deposition and Subsequent N+ Ion Implantation at Different Implantation Energies on Nano-Structure and Corrosion Behavior of 316 Stainless Steels

Nickel films of 300 nm thickness were deposited by electron beam evaporation at room temperature on 316 stainless steels. Corrosion studies of Ni coated 316 SS have been performed after N+ ion implantation at different energies of 20, 40, 60 and 80 keV. The structure and surface morphology of the films were evaluated using X-ray diffraction (XRD), atomic force microscope (AFM) an...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1998